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ZTE Completes TD-LTE S1/X2 Interface Conformity Test with MII

ByPankaj

Jun 1, 2010 , , ,

ZTE and China’s Ministry of Industry and Information Technology (MII) have announced completion of S1/X2 Interface Conformity test.

ZTE and China’s Ministry of Industry and Information Technology (MII) have announced completion of S1/X2 Interface Conformity test. ZTE claims it as the world’s first for TD-LTE and an important development under MII’s initiatives for the deployment of TD-LTE.

ZTE was invited by MII to conduct the trial in advance of mass-scale system tests due to the company’s leading position and rich experience in TD-LTE. The test was a success and passed all requirements set forth by MII for the S1/X2 Interface Conformity Test, making ZTE the first in the world to successfully complete the related trials.

ZTE has been actively involved and participated in TD-LTE tests organized by MII and China Mobile. The Company has realized many industry firsts in TD-LTE industry trials. It achieved TD-LTE’s highest theoretical peak download rate in November 2009. In December 2009, ZTE became the first vendor to pass the essential test set for TD-LTE single systems organized by the MTNET Lab of MII followed by the industry’s first field tests.

 In addition, in January 2010 ZTE passed the TD-LTE field test held by MII making it the first in the industry to submit a TD-LTE field test report to The LTE/SAE Trial Initiative(LSTI). Subsequently, ZTE successfully completed an indoor MIMO performance test in cooperation with China Mobile, underlining its key role in promoting TD-LTE industry-chain development.

Within LTE network infrastructure, the S1 interface is the communications interface between LTE eNB (base station) and EPC (packet core network), while the X2 interfaces between eNB and eNB. The success of the S1/X2 Interface Conformity test validates that ZTE’s TD-LTE system, including its wireless and core network, fully comply with 3rd Generation Partnership Project(3GPP)standards, and has laid down a solid foundation for the test of S1/X2 IOT.

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